abbr. SJ GMU
ISSN 2657-5841 (printed)
ISSN 2657-6988 (online)
DOI: 10.26408
Measurements of thermal resistance of solar cells
Abstract:
Streszczenie:
In the paper the problem of measurement of thermal resistance of solar cells is considered. The electric dc method of measurement of thermal resistance of semiconductor devices with the p-n junction is presented and the infrared and contact methods are described. Measurements of the dependence of thermal resistance of 3 types of solar cells on the current are made and the analysis of uncertainty of the measurement of the considered parameter is performed. It results from the carried out investigations that the use of the electric method is justified with big values of the current of the solar cell, assuring a significant rise of its internal temperature.
Issue:
Pages:
56
65
Download full text in pdf:
References:
Zarębski J., Górecki K., A Method of the Thermal Resistance Measurements of Semiconductor Devices with P-N Junction. Measurement, Vol. 41, No. 3, 2008, pp. 259–265.
Blackburn D.L., Temperature Measurements of Semiconductor Devices – A Review, 20th IEEE Semiconductor Thermal Measurement and Menagement Symposium SEMITHERM, 2004, pp. 70–80.
Michalski L., Eckerdorf K., Pomiary temperatury, WNT, Warszawa 1986.
Janke W., Zjawiska termiczne w elementach i układach półprzewodnikowych, WNT, Warszawa 1992.
Rubin S., Oettinger F., Thermal Resistance Measurement on Power Transistors, National Bureau of Standards, NBS 400-14, U.S. Dept. of Commerce, 1979.
Górecki K., Zarębski J., Modeling the influence of selected factors on thermal resistance of semiconductor devices. IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 4, No. 3, 2014, pp. 421-428.
Górecki K., Górecki P., Paduch K., Modelling solar cells with thermal phenomena taken into account. Journal of Physics: Conference Series, Vol. 494, 2014, 012007, doi:10.1088/1742-6596/494/1/012007
Górecki K., Krac E., Badanie wpływu temperatury na charakterystyki fotoogniw, XIII Krajowa Konferencja Elektroniki KKE 2014, Darłowo, 2014, pp. 367–372.
Rencz M., Farkas G., Poppe A., Szekely V., Courtois B., A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements, 28th International Electronics Manufacturing Technology Symposium, San Jose 2003, pp. 117–23.
Zarębski J., Górecki K., A New Method for the Measurement of the Thermal Resistance of the Monolithic Switched Regulator LT1073. IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 5, 2007, pp. 2101–2104.